Angewandte Naturwissenschaften, Energie-und Gebäudetechnik Prof. Dr. rer. nat. Arndt Jaeger
Arndt.Jaeger[at]hs-esslingen.de
Address
Campus Esslingen Flandernstraße
Room:
F 02.238
Flandernstraße 101
73732 Esslingen
Functions
Laborleitung
special functions
Responsibilities:
Laboratory "Physics B" and "Optics Lab"
Room F 02.238, Flandernstraße 101, 73732 Esslingen, Germany
vita
09/2014 - today
Professor (Experimentalphysik für Ingenieure)
Hochschule Esslingen, Germany
10/2011 - 08/2014
Patent Manager bei OLED-Entwicklung
OSRAM AG, Regensburg, Germany
02/2006 - 09/2011
Project Manager bei OLED-Entwicklung
OSRAM Opto Semiconductors, Regensburg, Germany
04/2000 - 01/2006
Entwicklungsingenieur bei LED/Laser-Entwicklung
OSRAM Opto Semiconductors, Regensburg, Germany
09/1998 - 03/2000
Research Associate, Electrical Engineering, UC Santa Barbara, USA
University of California at Santa Barbara, Santa Barbara, CA, USA
04/1998 - 09/1998
Research Associate, City University of New York, New York City, USA
City University of New York, USA
05/1993 - 09/1996
Physics, PhD thesis
Philipps-Universität Marburg, Germany
09/1986 - 08/1991
Physics, diploma thesis
Humboldt-Universität zu Berlin, Germany
publications
32.
A. Jaeger, N. Ledentsov Jr., H. Meinert, M. Stock, K. Ehling, I. E. Titkov, O. Yu. Makarov, N. N. Ledentsov,
“Impact of stress current on electro-optical properties of the cavity region in 850 nm VCSELs”,
Proc. of SPIE Vol. 12904 129040F-1 (2024)
31.
A. Jaeger, M. Bou Sanayeh, H. Meinert, M. Härer, O. Yu. Makarov, I. E. Titkov, N. Ledentsov Jr., N. N. Ledentsov,
“Photocurrent spectroscopy of 850nm oxide-confined vertical-cavity surface-emitting lasers”,
Proc. of SPIE Vol. 12020 120200I-1 (2022)
30.
S. Pecqueur, A. Maltenberger, M. A. Petrukhina, M. Halik, A. Jaeger, D. Pentlehner, G. Schmid
„Wide Band-Gap Bismuth-based p-Dopants for Opto-Electronic Applications“,
Angewandte Chemie 55, 10493 (2016)
29.
G. Schmidt, J. H. Wemken, A. Maltenberger, C. Diez, A. Jaeger, T. Dobbertin, O. Hietsoi, C. Dubceac, M. A. Petrukhina,
„Fluorinated Copper(I) Carboxylates as Advanced Tunable p-Dopands
for Organic Light-Emitting Diodes“,
Advanced Materials 26, 878 (2014)
28.
T. Schmidt, D. S. Setz, M. Flämmig, B. J. Scholz, A. Jaeger, C. Diez, D. Michaelis, N. Danz, W. Brütting,
„Degradation induced decrease of the radiative quantum efficiency
in organic light-emitting diodes“,
Applied Physics Letters 101, 103301 (2012)
27.
B. J. Scholz, J. Frischeisen, A. Jaeger, D. S. Setz, T. C. G. Reusch, W. Brütting,
„Extraction of surface plasmons in organic light-emitting diodes via high-index coupling“,
Optics Express 20, A205 (2012)
26.
P. Altieri, A. Jaeger, T. Lutz, P. Stauss, K. Streubel, K. Thonke, R. Sauer,
„Influence of doping on the reliability of AlGaInP LEDs“,
Journal of Materials Science: Materials in Electronics 43, 803 (2008)
25.
K.-D. Katzer, W. Mertin, G. Bacher, A. Jaeger, K. Streubel,
„Voltage drop in an (AlxGa1-x)0.5In0.5P light-emitting diode
probed by Kelvin probe force microscopy“,
Applied Physics Letters 89, 103522 (2006)
24.
M. Bou Sanayeh, A. Jaeger, W. Schmid, S. Tautz, P. Brick, K. Streubel,
„Investigation of dark line defects induced by catastrophic optical damage
in broad-area AlGaInP lasers diodes“,
Applied Physics Letters 89, 101111 (2006)
23.
R. Joray, M. Ilegems, R. Stanley, W. Schmid, R. Butendeich, R. Wirth, A. Jaeger, K. Streubel,
„Far-Field Radiation Pattern of Red Emitting Thin-Film Resonant Cavity LEDs“,
IEEE Photonics Technology Letters 18, 1052 (2006)
22.
W. Mertin, K.-D. Katzer, G. Bacher, A. Jaeger, K. Streubel,
„Kelvin force microscopy on a (AlxGa1-x)0.5In0.5P light-emitting diode“,
Proc. SPIE Int. Soc. Opt. Eng. 6134, 93 (2006)
21.
P. Altieri, A. Jaeger, R. Windisch, N. Linder, P. Stauss, R. Oberschmid, K. Streubel,
„Internal Quantum Efficiency of high-brightness AlGaInP Light-Emitting Diodes“,
Journal of Applied Physics 98, 86101 (2005)
20.
P. Altieri, A. Jaeger, P. Stauss, T. Pietzonka, K. Streubel,
„Efficiency and reliability of AlGaInP LEDs grown on Germanium substrates“,
Proc. SPIE Int. Soc. Opt. Eng. 5739, 93 (2005)
19.
R. Joray, M. Ilegems, R. Stanley, W. Schmid, R. Butendeich, R. Wirth, A. Jaeger, K. Streubel,
„High-brightness red-emitting AlGaInP thin film RCLEDs“,
Proc. SPIE Int. Soc. Opt. Eng. 5594, 190 (2004)
18.
P. Altieri, A. Jaeger, R. Windisch, N. Linder, P. Stauss, R. Oberschmid, K. Streubel,
„Color-dependent degradation of high-brightness AlGaInP LEDs“,
Proc. SPIE Int. Soc. Opt. Eng. 5349, 416 (2004)
17.
K. Streubel, N. Linder, R. Wirth, A. Jaeger,
„High-brightness AlGaInP light-emitting diodes“,
IEEE Journal of Selected Topics in Quantum Electronics 8, 321 (2002)
16.
O. Pursiainen, N. Linder, A. Jaeger, R. Oberschmid, K. Streubel,
„Identification of aging mechanisms
in the optical and electrical characteristics of light-emitting diodes“,
Applied Physics Letters 79, 2895 (2001)
15.
A. Jaeger, P. M. Petroff, T. D. Lowes,
„Angle-dependent photocurrent spectroscopy
of oxide-apertured vertical-cavity surface-emitting lasers during aging“,
Applied Physics Letters 78, 3012 (2001)
14.
T. Lundstrom, W. Schoenfeld, T. Mankad, A. Jaeger, H. Lee, P. M. Petroff,
„Splitting and storing excitons in strained coupled self-assembled quantum dots“,
Physics E 7, 494 (2000)
13.
A. Jaeger, W. D. Sun, F. H. Pollak, C. L. Reynolds, M. Geva,
„Characterization of p-dopant interdiffusion
in 1.3 mm InGaAsP/InP laser structures using modulation spectroscopy“,
Journal of Applied Physics 86, 2020 (1999)
12.
A. Jaeger, W. D. Sun, F. H. Pollak, C. L. Reynolds, M. Geva, D. V. Stampone, M. W. Focht, O. Y. Raisky, W. B. Wang, R. R. Alfano,
„Characterization of InGaAsP/InP p-i-n solar cell structures
using modulation spectroscopy and secondary ion mass spectrometry“,
Journal of Applied Physics 85, 1921 (1999)
11.
A. Jaeger, G. Weiser,
„Excitonic electroabsorption spectra and Franz-Keldysh effect of InGaAs/InP
studied by small modulation of static fields“,
Physical Review B 58, 10674 (1998)
10.
J. W. Tomm, A. Bärwolff, A. Jaeger, T. Elsässer, J. Bollmann, W. T. Masselink, A. Gerhardt, J. Donecker,
„Deep level spectroscopy of high power laser diode arrays“,
Journal of Applied Physics 84, 1325 (1998)
9.
R. Puchert, J. W. Tomm, A. Jaeger, A. Bärwolff, J. Luft, W. Späth,
„Emitter failure and thermal facet load in high power laser diode arrays“,
Applied Physics A 66, 483 (1998)
8.
J. W. Tomm, A. Jaeger, A. Bärwolff, T. Elsässer, A. Gerhardt, J. Donecker,
„Aging properties of high power laser diode arrays
analyzed by Fourier-transform photo-current measurements“,
Applied Physics Letters 71, 2233 (1997)
7.
A. Jaeger, G. Weiser, P. Wiedemann, I. Gyuro, E. Zielinski,
„The size of coherent bandstates in semiconductors, derived from the Franz-Keldysh effect“,
Journal of Physics C 8, 6779 (1996)
6.
A. Jaeger, G. Weiser, P. Wiedemann,
„Inhomogeneous exciton broadening and mean free path in InGaAsP/InP heterostructures“,
IEEE Journal of Selected Topics in Quantum Electronics 1, 1113 (1995)
5.
A. Jaeger, W. Hoerstel, M. Thiede, P. Schäfer, J. Elsing,
„2D channel transport of metal-insulator semiconductor field effect transistors
on narrow-gap HgCdTe (0.2<x<0.3)“,
Semiconductor Science & Techn. 9, 54 (1994)
4.
G. Nachtwei, C. Breitlow, A. Jaeger, P. Svoboda, P. Streda, M. Cukr, L. Bliek, F.-J. Ahlers, H. Schlegel,
„Temperature-dependent scaling and current-dependent non-ohmic behaviour
between integer quantum Hall plateaux“,
Semiconductor Science & Techn. 8, 25 (1993)
3.
G. Nachtwei, C. Breitlow, A. Jaeger, J. Breitlow-Hertzfeldt,
„Breakdown of the quantum Hall effect
as a function of the filling factor and the contact configuration“,
Journal of Physics C 4, 4003 (1992)
2.
P. Svoboda, P. Streda, G. Nachtwei, A. Jaeger, M. Cukr, M. Laznicka,
„Current-induced coupling of the edge and bulk channels in GaAs/AlGaAs heterostructures“,
Physical Review B 45, 8763 (1992)
1.
G. Nachtwei, O. Salchow, C. Breitlow, A. Jaeger, H. Krüger,
„Density of states of the 2DES at Si-MOS and Si-MNOS devices in the quantum Hall regime“,
Surface Science 250, 243 (1991)
Research interests
- optoelectronic devices, e.g. light emitting devices (LED), laser diodes (e.g. VCSEL - vertical cavity surface emitting laser) and detectors
- microscopical and spectral analysis of semiconductor devices utilizing a confocal scanning optical microscope
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